Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands

Description:

https://www.google.com/patents/US7925080

Patent Information:
For Information, Contact:
Simon Nynens
VP, Business Incubation
New Jersey Institute of Technology
simon.nynens@njit.edu
Inventors:
Yun-Qing Shi
ChunHua Chen
Keywords:
Patent Issued
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