Method and apparatus of A Statistical Pattern Recognition System for Steganalysis of Image Data Hiding

Description:

https://www.google.com/patents/US7496210

Patent Information:
For Information, Contact:
Simon Nynens
VP, Business Incubation
New Jersey Institute of Technology
simon.nynens@njit.edu
Inventors:
Yun-Qing Shi
GuoRong Xuan
Keywords:
Patent Issued
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